Committee E42 Subcommittees
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Standards under the jurisdiction of E42
E42.02 Terminology
E42.03 Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
E42.06 SIMS
E42.08 Ion Beam Sputtering
E42.13 Vacuum Technology
E42.14 STM/AFM
E42.15 Electron Probe Microanalysis/Electron Microscopy
E42.90 Executive
E42.91 Awards
E42.92 US TAG ISO/TC 201
E42.94 US TAG ISO/TC 112
E42.96 US TAG ISO/TC 202